2004-11-08 1985 to 1987: My years with D&T. 173-174 2004 21 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2004/03/d3173.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Agrawal04 2004-11-08 SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. 200-207 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.19 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#ShoukourianVZ04 2004-11-08 A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation. 111-120 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2111abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#YenJC04 2005-07-26 New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. 241-247 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.17 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MakKCW04 2004-11-08 Conference Reports. 68- 2004 21 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Li04 2004-11-08 Silicon for embedded multimedia processing. 345- 2004 21 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2004/05/d5345.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Gupta04c 2004-11-08 Open-source hardware. 456- 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.68 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Davidson04b 2004-11-08 Verification evolution or industrial revolution? 168- 2004 21 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Varma04 2004-11-08 Impact of Design-Manufacturing Interface on SoC Design Methodologies. 183-191 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.13 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#CarballoN04 2004-11-08 Safety Property Verification Using Sequential SAT and Bounded Model Checking. 132-143 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2132abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#ParthasarathyICW04 2004-11-08 Southwest Test Workshop 2004. 159- 2004 21 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Mann04 2004-11-08 From the Editor in Chief: Predictability in Design and Manufacturing. 1- 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1001.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Gupta04 2004-11-08 Efficient and Economical Test Equipment Setup Using Procorrelation. 34-43 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1034abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#LinWL04 2004-11-08 The continuing evolution of EDA standards. 450-451 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.71 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MarschnerB04 2004-11-08 Test at Gbps: Megaproblem or micromanagement? 344- 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Aitken04 2004-11-08 Looking back, looking around. 271-273 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#DasGupta04 2004-11-08 Guest Editors' Introduction: RTL to GDSII - From Foilware to Standard Practice. 9-12 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1009.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#HillK04 2004-11-08 Cypress: Compression and Encryption of Data and Code for Embedded Multimedia Systems. 406-415 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.55 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#LekatsasHCJ04 2004-11-08 Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification. 84-93 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2084abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#AdirAFMRVZ04 2004-11-08 Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. 302-313 2004 21 IEEE Design & Test of Computers 4 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.34 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#OuFKTI04 2004-11-08 ITC 2003 panels: Part 2. 175-176 2004 21 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#StolicnySMEL04 2004-11-08 Dynamic Backlight Adaptation for Low-Power Handheld Devices. 398-405 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.57 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#PasrichaLMDV04 2004-11-08 Design automation Technical Committee Newsletter. 343- 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#WillisD04 2004-11-08 ITC 2003 panels: Part 1. 160-163 2004 21 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#StolicnyKPHA04 2004-11-08 A Backlight Power Management Framework for Battery-Operated Multimedia Systems. 388-396 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.43 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#ShimCP04 2004-11-08 Low-Power Design Using Multiple Channel Lengths and Oxide Thicknesses. 56-63 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1056abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#SirisantanaR04 2004-11-08 From the EIC: The next EDA challenge - Design for manufacturability. 169- 2004 21 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2004/03/d3169.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Gupta04b 2004-11-08 Design Automation Technical Committee Newsletter. 69- 2004 21 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04 2004-11-08 DAC Highlights. 259-260 2004 21 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Lavagno04 2004-11-08 Understanding Yield Losses in Logic Circuits. 208-215 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.21 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#AppelloFGTGM04 2004-11-08 Serving a growing community: How D&T began. 79- 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2079.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Russo04 2004-11-08 Conference Reports. 350-353 2004 21 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2004/05/d5350.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04f 2004-11-08 From the EIC: Past successes, future challenges. 77-78 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2077.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Gupta04a 2004-11-08 From Protocol Models to Their Implementation: A Versatile Testing Methodology. 416-428 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.61 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#VarsamouPA04 2004-11-08 ITC 2003 Roundtable: Design for Manufacturability. 144-156 2004 21 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#AitkenEMKW04 2004-11-08 Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. 274-276 2004 21 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2004/04/d4274.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#IvanovLM04 2004-11-08 Panel Summaries. 342- 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04e 2004-11-08 Conference Reports. 339-341 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04d 2004-11-08 Integrated Task Scheduling and Data Assignment for SDRAMs in Dynamic Applications. 378-387 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.66 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MarchalCBBGP04 2004-11-08 Testing Gbps Interfaces without a Gigahertz Tester. 278-286 2004 21 IEEE Design & Test of Computers 4 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.42 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MakTM04 2004-11-08 Design Automation Technical Committee Newsletter. 263- 2004 21 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04b 2004-11-08 A Built-In Parametric Timing Measurement Unit. 322-330 2004 21 IEEE Design & Test of Computers 4 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.22 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#HsiaoHC04 2004-11-08 DATC Newsletter. 455- 2004 21 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2004/05/d5455.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04h 2004-11-08 Logic Synthesis for Manufacturability. 192-199 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.15 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#NardiS04 2004-11-08 Design Automation TC Newsletter. 166- 2004 21 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#WillisK04 2004-11-08 A practical look at ATPG. 448-449 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.44 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Davidson04a 2004-11-08 Automatic Test Program Generation: A Case Study. 102-109 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2102abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#CornoSRS04 2004-11-08 Guest Editors' Introduction: Designing Real-Time Embedded Multimedia Systems. 354-356 2004 21 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2004/05/d5354.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MarculescuE04 2004-11-08 Test Technology TC Newsletter. 70-71 2004 21 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04a 2004-11-08 From the EIC: Manufacturing test woes. 269-270 2004 21 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2004/04/d4269.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#X04c 2004-11-08 Paperless Design and Test. 72- 2004 21 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Davidson04 2004-11-08 DFT for Delay Fault Testing of High-Performance Digital Circuits. 248-258 2004 21 IEEE Design & Test of Computers 3 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.10 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#ChatterjeeSK04 2004-11-08 Design & Test Education in Asia. 331-338 2004 21 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#DasFLMXZ04 2004-11-08 Guest Editors' Introduction: The Verification and Test of Complex Digital ICs. 80-82 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2080.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#AbadirW04 2004-11-08 Crosstalk-Aware Placement. 24-32 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1024abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#LouC04 2004-11-08 On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz. 314-321 2004 21 IEEE Design & Test of Computers 4 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.38 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#SunterR04 2004-11-08 A Top-Down Methodology for Microprocessor Validation. 122-131 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2122abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#MishraDKA04 2004-11-08 Multiplexing ATE Channels for Production Testing at 2.5 Gbps. 288-301 2004 21 IEEE Design & Test of Computers 4 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.37 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#KeezerMC04 2004-12-07 An Industrial Evaluation of DRAM Tests. 430-440 2004 21 IEEE Design & Test of Computers 5 http://doi.ieeecomputersociety.org/10.1109/MDT.2004.51 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Goor04 2004-11-08 Seamless Test of Digital Components in Mixed-Signal Paths. 44-55 2004 21 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2004/01/d1044abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#OzevBO04 2004-11-08 Validating the Itanium 2 Exception Control Unit: A Unit-Level Approach. 94-101 2004 21 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2004/02/d2094abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#ScafidiGB04 2004-11-08 Current testing for nanotechnologies: Myths, facts, and figures. 264- 2004 21 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt21.html#Manhaeve04 2004-11-08 From the Editor in Chief: Full Circle? 1- 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Gupta03a 2004-11-08 Testing and Characterization of SDRAMs. 42-50 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1042abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Vollrath03 2004-11-08 The Evolution of SystemVerilog. 82-84 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Rich03 2004-11-08 Conference Reports. 115- 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03f 2004-11-08 From the Editor in Chief: Twenty years! 1- 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Gupta03 2004-11-08 DAC Highlights. 88-89 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#LavagnoF03 2004-11-08 Conference Reports. 88-89 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03c 2004-11-08 Embedded-Memory Test and Repair: Infrastructure IP for SoC Yield. 58-66 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3058abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#ZorianS03 2004-11-08 Fast Fault Simulation for Nonlinear Analog Circuits. 40-47 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2040abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#EnginK03 2004-11-08 Who Cares about System Verification? 114- 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Anderson03 2004-11-08 Test's Evolving Mission. 95-96 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Mann03 2004-11-08 Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. 6-7 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5006.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#ButlerCW03 2004-11-08 DAC: Serving the EDA Community for 40 Years. 97-98 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Pistilli03 2004-11-08 Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. 84-89 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5084abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Maxwell03 2004-11-08 An On-Chip Self-Repair Calculation and Fusing Methodology. 67-75 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5067abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#AnandCFJOOW03 2004-11-08 How much variability can designers tolerate? 96-97 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Kahng03b 2004-11-08 All I Know I Learned at ITC. 104- 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Davidson03 2004-11-08 Infrastructure IP for Configuration and Test of Boards and Systems. 78-87 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3078abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#ClarkR03 2004-11-08 Electrical Modeling of Integrated-Package Power and Ground Distributions. 24-31 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3024abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#ZhengKP03 2004-11-08 McCluskey Awarded TTTC Lifetime Contribution Medal. 89- 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03j 2004-11-08 TTTC Newsletter. 94-95 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03a 2004-11-08 Speed Binning with Path Delay Test in 150-nm Technology. 41-45 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5041abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#CoryKU03 2004-11-08 A Design-for-Verification Technique for Functional Pattern Reduction. 48-55 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2048abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#LiuCJ03 2004-11-08 Guest Editors' Introduction: Application-Specific Microprocessors. 6-7 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#OrailogluV03 2004-11-08 An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. 60-67 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1060abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#AzaisBRIT03 2004-11-08 The Tides of EDA. 59-75 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6059abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Sangiovanni-Vincentelli03a 2004-11-08 Guest Editors' Introduction: Board Test. 5-7 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2005abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#BodoniB03 2004-11-08 A Practical Methodology for Verifying Pipelined Microarchitectures. 4-14 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4004abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#HosabettuGS03 2004-11-08 Design Techniques for EEPROMs Embedded in Portable Systems on Chips. 68-75 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1068abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#DagaPMRMGA03 2004-11-08 From the Editor in Chief: Addressing Problems of the Large. 3- 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4003.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Gupta03c 2004-11-08 Application-Specific Instruction Memory Customizations for Power-Efficient Embedded Processors. 18-25 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1018abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#PetrovO03 2004-11-08 Implementation of a Self-Timed Segmented Bus. 44-50 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6044abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#PlosilaSL03 2004-11-08 DATC Newsletter. 118- 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03h 2004-11-08 Test Data Compression. 76-87 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03b 2004-12-09 Embedded Boundary Scan. 20-25 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2020abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#TreurenM03 2004-11-08 ITC 2002 Panels: Part 2. 90-91 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Stolicny03a 2004-11-08 Guest Editors' Introduction: Clockless VLSI Systems. 5-8 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6005.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#HassounKL03 2004-11-08 Testing for what? 96- 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Parker03 2004-11-08 ARM Twisting with Sir Robin: An Interview with ARM Chairman Sir Robin Saxby. 90-93 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5090abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03m 2004-11-08 New advanced library format standard approved. 98-99 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Roethig03 2004-11-08 Compilation for FPGA-Based Reconfigurable Hardware. 65-75 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2065abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#CardosoN03 2004-11-08 Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. 8-18 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2008abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MarinissenVHB03 2004-11-08 Impact of Low-Impedance Substrate on Power Supply Integrity. 16-22 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3016abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#PandaSB03 2004-11-08 Three Generations of Asynchronous Microprocessors. 9-17 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6009abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MartinNW03 2004-11-08 DATC Newsletter. 93- 2003 20 IEEE Design & Test of Computers 2 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03d 2004-11-08 Efficient System-Level Functional Verification Methodology for Multimedia Applications. 56-64 2003 20 IEEE Design & Test of Computers 2 http://csdl.computer.org/comp/mags/dt/2003/02/d2056abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#CupakCM03 2004-11-08 AC Scan Path Selection for Physical Debugging. 34-40 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5034abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#CrouchPD03 2004-11-08 Achieving At-Speed Structural Test. 26-33 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5026abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Pateras03 2004-11-08 2D Test Sequence Generators. 51-59 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1051abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MrugalskiTR03 2004-11-08 TTTC Newsletter. 90-91 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03k 2004-11-08 Embedded Memories for the Future. 66-81 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03i 2004-11-08 Clock and Power Gating with Timing Closure. 32-39 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3032abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MukherjeeM03 2004-11-08 Making the Best of Those Extra Transistors. 96- 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Vahid03 2004-11-08 Power-Conscious Test Synthesis and Scheduling. 48-55 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4048abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#NicoliciA03 2004-11-08 Fault Models and Test Generation for Hardware-Software Covalidation. 40-47 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4040abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Harris03 2004-11-08 DATC Newsletter. 93- 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03l 2004-11-08 DAC, Moore's Law Still Drive EDA. 99-100 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Rohrer03 2004-11-08 Automating Wave-Pipelined Circuit Design. 51-58 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6051abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#KimK03 2004-11-08 Hot Topics at HLDVT 02. 92- 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Jerraya03 2004-11-08 2003 Annual Index IEEE Design & Test of Computers Volume 20. 108-119 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6108.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03u 2004-11-08 High-Frequency, At-Speed Scan Testing. 17-25 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5017abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#LinPRRRST03 2004-11-08 Power-Aware Designers at Odds with Power Grid Designers? 120- 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Irwin03 2004-11-08 Panel Summaries. 100-102 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#DupontM03 2004-11-08 Orthogonality of Verilog Data Types and Object Kinds. 94-96 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Lawrence03 2004-11-08 First CADathlon Programming Contest held at 2002 ICCAD. 104-107 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#HassounJ03 2004-11-08 An Efficient, Low-Cost I/O Subsystem for Network Processors. 56-64 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4056abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#PnevmatikatosSV03 2004-11-08 Compacting Test Responses for Deeply Embedded SoC Cores. 22-30 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4022abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#SinanogluO03 2004-11-08 DATC Newsletter. 100- 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03o 2004-11-08 ITC 2003: Breaking Test Interface Bottlenecks. 54- 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#AitkenR03 2004-11-08 A 100-GOPS Programmable Processor for Vehicle Vision Systems. 8-16 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1008abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#RaabBHHRST03 2004-11-08 Conference Reports. 97-99 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03n 2004-11-08 At-Speed Testing: A Shared Red Brick between Design and Test. 1- 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5001.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Gupta03d 2004-11-08 Instruction Scheduler Generation for Retargetable Compilation. 34-41 2003 20 IEEE Design & Test of Computers 1 http://csdl.computer.org/comp/mags/dt/2003/01/d1034abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#WahlenHLM03 2004-11-08 From the EIC: The changing face of IC design and its industry. 1- 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6001.pdf http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Gupta03e 2004-11-08 Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. 46-53 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5046abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MadgeBD03 2005-06-09 IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. 76-83 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5076abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#EklowBP03 2004-11-08 TTTC Newsletter. 102-103 2003 20 IEEE Design & Test of Computers 5 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03p 2004-11-08 Test Technology TC Newsletter. 104-105 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03s 2004-11-08 Embedded Deterministic Test for Low-Cost Manufacturing. 58-66 2003 20 IEEE Design & Test of Computers 5 http://csdl.computer.org/comp/mags/dt/2003/05/d5058abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#RajskiKMTTQ03 2004-11-08 A Hierarchical Infrastructure for SoC Test Management. 32-39 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4032abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#BensoCPZ03 2004-11-08 Error Tolerance. 86-87 2003 20 IEEE Design & Test of Computers 1 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Kahng03 2004-11-08 Design Automation Technical Committee Newsletter. 106- 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03t 2004-12-09 Solving Satisfiability in Combinational Circuits. 16-21 2003 20 IEEE Design & Test of Computers 4 http://csdl.computer.org/comp/mags/dt/2003/04/d4016abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Marques-SilvaS03 2004-11-08 Online Self-Repair of FIR Filters. 50-57 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3050abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#BensoCNP03 2004-11-08 Analysis and Optimization of Power Grids. 7-15 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3007abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#SapatnekarS03 2004-11-08 Bringing down NRE. 110-111 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Kahng03a 2004-11-08 What Is the Next Implementation Fabric? 86-95 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03r 2004-11-08 Conference Reports. 103- 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#HahanovU03 2004-11-08 Guest Editors' Introduction: On-Chip Power Distribution Networks. 5-6 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#NassifH03 2004-11-08 CASS Brings Publishing to Its DAC Partnership. 101-102 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Micheli03 2004-11-08 Fabless or IDM? What the Future Holds for Both: An Interview with Cirrus Logic Chairman, Michael L. Hackworth. 76-85 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#X03q 2004-11-08 Design and Characterization of Null Convention Self-Timed Multipliers. 26-36 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6026abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#BandapatiSC03 2004-11-08 Reducing Power Dissipation, Delay, and Area in Logic Circuits by Narrowing Transistors. 18-24 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6018abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Unger03 2004-11-08 Benefits of a SoC-Specific Test Methodology. 68-77 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3068abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#QuasemJG03 2004-11-08 Panel Summaries. 86-88 2003 20 IEEE Design & Test of Computers 4 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#PixleyC03 2004-11-08 A clockless future for systems on chip. 120- 2003 20 IEEE Design & Test of Computers 6 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#KimZ03 2004-11-08 VHDL-200X: The Next Revision. 112-113 2003 20 IEEE Design & Test of Computers 3 http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#Ashenden03a 2004-11-08 Cycle Decomposition in NCL. 38-43 2003 20 IEEE Design & Test of Computers 6 http://csdl.computer.org/comp/mags/dt/2003/06/d6038abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#MastellerS03 2004-11-08 Microarchitectural dI/dt Control. 40-47 2003 20 IEEE Design & Test of Computers 3 http://csdl.computer.org/comp/mags/dt/2003/03/d3040abs.htm http://www.informatik.uni-trier.de/~ley/db/journals/dt/dt20.html#GrochowskiAT03 2004-11-08